AT DAQ-S
Test & Measurement Systems

Fully configurable end-of-line and functional test systems. PCBA FCT, EOL test, RF, CAN/LIN/K-Line protocols, machine vision, and firmware programming — all in a single station, on a fixed-price contract.

<90s
Typical cycle time
6+
Protocol types
0
Test escapes
NI
LabVIEW / PXI
WHAT IS AT DAQ-S

One station.
Every test your DUT needs.

AT DAQ-S is Artemis's configurable test software and hardware platform built on NI LabVIEW and PXI. It consolidates multiple test categories — electrical, protocol, RF, vision, firmware — into a single station with a single test sequence, a single operator touchpoint, and a single TDMS result file.

The hardware is specified to your DUT. The software is written to your test specification. The fixture is designed to your connector pinout and mechanical envelope. Nothing is off-the-shelf — but the platform foundation means we don't start from zero on every project.

PCBA FCT EOL Test Hipot / Insulation RF Test CAN / LIN / K-Line Firmware Programming Machine Vision Calibration Rigs ICT (In-Circuit Test) Harness Continuity
Test & Measurement AT DAQ-S
From a delivered project

"Tests GPS, 4G, Bluetooth, and CAN in one station and logs every result in real time. Cycle time: 88 seconds. Zero test escapes in the first 3 months."

— Telematics unit EOL system, Vehicle Telematics Manufacturer, Pune
PROTOCOL & INTERFACE COVERAGE

What AT DAQ-S tests — protocol by protocol

CAN / CAN FD
Vector CANalyser interface. Broadcast, receive, DBC decoding, diagnostic UDS.
LIN
LIN 2.x master/slave simulation. Schedule table execution. Checksum verification.
K-Line / OBD
ISO 9141 / KWP2000. ECU diagnostics and calibration readback.
RS-232 / RS-485
UART AT command sequences. Modem, GPS NMEA string validation.
USB Type A & C
Enumeration, charging spec (USB-PD), data transfer rate verification.
Ethernet / LAN
TCP/IP ping, HTTP GET/POST, OCPP heartbeat for EV charger test.
4G / LTE
AT command SIM registration, signal strength, data session establishment.
GPS / GNSS
NMEA sentence parsing. Fix acquisition verification. Position accuracy check.
Bluetooth / Wi-Fi
RF link verification, RSSI check, data exchange sequence.
RF (up to 6 GHz)
Frequency, power, modulation — Rohde & Schwarz / Keysight instrument integration.
Firmware Programming
JTAG / SWD / UART bootloader. CRC verification post-flash. Version readback.
Analog / Power
Voltage, current, power factor, efficiency. NI DAQmx / Keysight DAQ. Full waveform or RMS.
PLATFORM CAPABILITIES

Every AT DAQ-S system delivers

Custom DUT Fixture

Designed to your connector pinout and mechanical envelope. Pogo pin or direct connector. Part-present sensor. Pneumatic clamping where required.

Full TDMS Traceability

Every test result — serial number, timestamp, all measured values, PASS/FAIL per parameter — logged to TDMS. CSV export and SQL write available.

Operator Guided UI

Step-by-step touchscreen prompts. Pass/fail displayed in plain English. No interpretation required from the operator. Multilingual support available.

Auto-Generated Test Report

PDF test report generated per DUT at cycle end. Includes all measurements, limits, PASS/FAIL, operator ID, and station ID. Ready for customer quality records.

Recipe-Driven Limits

Test limits loaded from external CSV/XML — no code change for limit updates. Password-protected limit editing. Variant selection by barcode scan.

MES / ERP Integration

OPC-UA, REST API, MQTT, Modbus TCP, SQL write. Real-time result push to MES. Barcode / RFID scan at station entry for traceability chain continuity.

TECHNICAL SPECIFICATIONS

AT DAQ-S — standard platform options

Parameter Specification Notes
Core platform NI LabVIEW 2020+ / NI PXI chassis NI cDAQ and PC-based variants available for lower-cost configurations
Measurement accuracy Voltage: ±0.01% of reading. Current: ±0.05% of reading. Power: ±0.1% NI PXI-4110 / Keysight 34461A class instruments
Protocol interfaces CAN/CAN FD, LIN, K-Line, RS-232, RS-485, USB A/C, Ethernet, 4G/LTE, GPS, Bluetooth, Wi-Fi, RF (up to 6 GHz) Protocol selection per DUT requirement
Cycle time Designed to customer's UPH target. Typical: 30–120 seconds per DUT Parallel test sequencing used where DUT architecture allows
Fixture type Custom pogo pin or direct connector. Pneumatic or manual clamping Fixture mechanical drawing provided at Gate G3
Operator UI 10" or 15" colour touchscreen. Step-by-step guided test with PASS/FAIL display LabVIEW front panel or NI TestStand-based sequence
Data logging TDMS per DUT cycle. CSV / SQL / OPC-UA output Local database + MES integration as required
Firmware programming JTAG / SWD / UART bootloader. CRC verification. Version readback Supported devices: STM32, NXP, Renesas, Microchip, TI
Safety Hipot: up to 3kVAC / 4.2kVDC. Electrical safety per IEC 61010-1 Interlock on fixture open. HV warning indicators
Enclosure Steel powder-coated enclosure, IP54. 19" rack or bench-top configurations Custom enclosure dimensions on request
Lead time 6–10 weeks from DUT sample receipt to FAT DUT sample required at Gate G4 for software development
Warranty 12 months from SAT sign-off AMC available from Year 2
DELIVERED PROJECTS

AT DAQ-S — case studies

AT DAQ-S · Telecom & Communications

Telematics Unit EOL Test System

Telematics Unit EOL Test System
The challenge

100% production test covering GPS, 4G/LTE, Bluetooth, Wi-Fi, CAN bus, and power management within a 90-second cycle. Previous approach: 3 separate stations causing test escapes and low throughput.

The solution

AT DAQ-S single-station EOL system. All 6 test categories run sequentially: GPS (NMEA validation), cellular (AT command), Bluetooth/Wi-Fi (RF), CAN (broadcast/receive), and power management. Custom DUT fixture with 48-pin pogo pin array.

88-second cycle (target: 90 s) Zero test escapes — first 3 months 310 units/8-hour shift Customer expanded to 3 identical systems 3 stations → 1 station
AT DAQ-S · EV & Automotive

2-Wheeler EOL Tester — 12 Component Parameters

2-Wheeler EOL Tester
The challenge

End-of-line verification of 12 electronic components — throttle position, speed sensor, instrument cluster, head lamp controller, rectifier regulator, DC-DC converter, CDI, ECS, BAS/ROS — in a sub-60-second cycle.

The solution

AT DAQ-S multi-channel tester with custom wire harness simulator fixture. Each component tested with its specific stimulus and measurement — ratiometric sweep, Hall pulse train, CAN/LIN, PWM duty cycle, and more.

45-second cycle per vehicle harness 12 components, 1 station TDMS result per serial number Zero escapes to field — 6 months
WHY ARTEMIS FOR TEST SYSTEMS

The AT DAQ-S difference

  • We write test software from your test specification — not from our assumptions. The first review meeting is about your DUT, not our platform.
  • Multi-protocol in a single station. No separate RF station, no separate CAN station. One fixture, one operator action, one result file.
  • NI LabVIEW platform means the test IP stays with you — readable, maintainable source code delivered as part of every project.
  • DUT fixture designed in-house. Connector mapping, pogo pin layout, clamping mechanism — all engineered to your specific DUT geometry.
  • Fixed price. You know the cost before we start. No time-and-materials surprises at the end of a 12-week project.
  • We stay on site until the system passes SAT. Our engineers commission the tester on your floor, in your production environment.

Instrument & Platform Partnerships

Test Platform
NI LabVIEW NI TestStand NI PXI / cDAQ
Instruments
Keysight Rohde & Schwarz Chroma Hioki Yokogawa
Protocol Tools
Vector CANalyser PEAK PCAN Kvaser

Typical Project Profile

Project value Rs. 15 lakh – Rs. 1.5 Cr
Delivery timeline 6–10 weeks from DUT sample
Commercial model Fixed price, milestone invoicing
Warranty 12 months from SAT

Send us your test specification.
We'll send back a technical approach.

Share your DUT, your test parameters, and your cycle time target. We respond within 24 hours with a coverage plan and budget indication — no obligation.

Or call us: +91 9028269123 · sales@artemistech.co.in